Name: Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (en Inglés)
Price: 161.57 EUR
Availability: InStock
Author: Cancellieri, Claudia ; Strocov, Vladimir N.
ISBN: 9783030091217

portada Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Cancellieri, Claudia ; Strocov, Vladimir N.

Idioma

Inglés

N° páginas

320

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 1.8 cm

Peso

0.47 kg.

ISBN13

9783030091217

Categorías

Fïsica de la materia condensada
Análisis espectral | espectroquímica
Ingeniería aplicada de revestimientos de superficies, capas y películas

Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (en Inglés)

Cancellieri, Claudia ; Strocov, Vladimir N. (Autor) · Springer · Tapa Blanda

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161,57 €

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (en Inglés)"

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.